Fly-scan ptychography

doi:10.1038/srep09074

2015-03-13

DOI：10.1038/srep09074

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摘要

En 中文

We report an experimental ptychography measurement performed in fly-scan mode. With a visible-light laser source, we demonstrate a 5-fold reduction of data acquisition time. By including multiple mutually incoherent modes into the incident illumination, high quality images were successfully reconstructed from blurry diffraction patterns. This approach significantly increases the throughput of ptychography, especially for three-dimensional applications and the visualization of dynamic systems.

Keyword:

K-B MIRRORS

COMPUTED-TOMOGRAPHY

PHASE-RETRIEVAL

RAY

DIFFRACTION

RESOLUTION

MICROSCOPY

OPTIMIZATION

EIGER

BEAM

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期刊

Scientific Reports

IF:

3.9

论文数:

27.9W

被引数:

83.5W

机构

SLAC National Accelerator Laboratory

学者数:

4.3K

论文数: 2.5K

被引数: 1.7W

united states department of energy (doe)

学者数:

11.3W

论文数: 9.6W

被引数: 246

Brookhaven National Laboratory

学者数:

6.4K

论文数: 4.9K

被引数: 1.9W

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