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Fourier-Plane Phase Synchronization for Interferometric Scattering Microscopy
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DOI：10.1021/acsphotonics.6c00534.png)
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Abstract
En 中文
We identify that the inhomogeneous phase differences between the scattering components and reference field on the Fourier plane, in high numerical-aperture interferometric scattering microscopy and in imaging systems with aberration, severely distort the interferometric point-spread function (iPSF). We introduce the concept of Fourier-plane phase-difference synchronization, whereby all the scattering components share a fixed phase difference relative to the reference, to reshape the iPSF toward perfect circular symmetry and enhanced signal. In particular, synchronizing the phase differences to π/2 between the scattered and reference components in the Fourier plane results in an axially antisymmetric iPSF, which we demonstrate to suppress the interferometric speckle background. Experimentally, Fourier-plane phase-difference synchronization is implemented using a photothermal spatial light modulator, producing 50% signal enhancement and an iPSF with almost-perfect circular symmetry. Experimental suppression of the speckle background enables reliable detection of 10 nm particles immobilized on a substrate that are otherwise indecipherable in the random background pattern. Our concept and the implementation technique provide a powerful asset for advanced optical microscopy.
Keywords:
interferometric scattering microscopy
Fourier-plane phase synchronization
photothermal spatial light modulator
point spread function optimization
speckle suppression
nanoparticle detection
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