arrow
返回

Generalized Integrated Interleaved Codes for High-Density DRAMs

delete2024-01-01
delete1
PRE
AI
Y
Yok Jye Tang
X
Xinmiao Zhang *
DOI:10.1109/TCSII.2023.3307502delete
delete原文链接
delete原文求助
delete分享
delete收藏
摘要

摘要

En 中文
As the density of dynamic random-access memories (DRAMs) keeps increasing, which results in higher error rates, the conventional single error correction and double error detection codes are no longer sufficient. Generalized integrated interleaved (GII) codes based on Reed-Solomon (RS) codes are among the best error-correcting codes for high-density DRAMs due to their hyper-speed decoding and good correction capability. However, the very short codeword length required by DRAMs leads to miscorrections that substantially degrade the error-correcting performance of GII-RS codes if untreated. Previous miscorrection mitigation schemes for longer GII-BCH codes lead to additional code rate loss when applied to very short GII-RS codes and hence affect the cost of DRAMs. This brief presents new miscorrection mitigation schemes with improved code rates. A small number of parity bits are allocated in an optimized manner and decoding trials are carried out to close the performance gap. Moreover, low-latency hardware implementation architectures have been developed for the proposed GII-RS decoder. For the example code considered for DRAMs, the proposed decoder reduces the worst-case latency by 45% with small area overhead while keeping the same average latency and critical path compared to the best possible alternative design.
Keyword:
Dynamic random-access memories
generalized integrated interleaved codes
hardware architecture
miscorrection
reed-solomon codes

期刊

I
IEEE Transactions on Circuits and Systems and Express Briefs
IF:
4.9
论文数:
8.8K
被引数:
2.5W

机构

U
University System of Ohio
学者数:
15.5W
论文数: 13.0W
被引数: 200
引用论文

引用论文

err2002-01-01
err0
PREAI
errMauro Pacella; Carlo Corbu; Angelo Naselli; Paolo Quilici; Giorgio Carmignani
err分享
err收藏
err分享
err收藏
Optimization of diffraction grating profiles in fabrication by electron-beam lithography
err2004-09-20
err0
PREAI
errMasato Okano; Hisao Kikuta; Yoshihiko Hirai; Kazuya Yamamoto; Tsutom Yotsuya
err分享
err收藏
Addressing multiple bit/symbol errors in DRAM subsystem
err2021-02-09
err2
errOAAI
errYeleswarapu, Ravikiran; Somani, Arun K.
err分享
err收藏
学者 查看更多内容