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High-precision absolute distance measurement by cascaded synthetic wavelength interferometry using a single electro-optic frequency comb

delete2025-02-28
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OA
AI
R
Runmin Li *
H
Haochen Tian
刘杨 (Yang Liu)
D
Dengfeng Dong
Ł
Łukasz A. Sterczewski
Z
Zhou, Weihu
DOI:10.1364/OE.553690delete
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Abstract

Abstract

En 中文
We demonstrate high-precision absolute distance measurement through cascaded synthetic wavelength interferometry (SWI) based on a single GHz-rate electro-optic frequency comb (EO comb). For this purpose, 3 of its discrete comb modes are selectively filtered by cascaded dense wavelength division multiplexers to serve as phase-linked continuous-wave (CW) lasers with relative frequency stability inherited from the microwave frequency reference. We vary the frequencies of these comb modes to generate a series of synthetic wavelengths by periodically switching the EO comb repetition rate. This allows us to obtain a maximum non-ambiguity range (NAR) of similar to 3.74 m accompanied by the instrument's +/- 4 mu m precision validated by a commercial HeNe interferometer. In addition to static targets, a velocity measurement with < +/- 15 m/s residual compared to the HeNe interferometer is also shown. Our simple and robust technique for high-precision absolute distance and velocity measurement is well-suited for many industry-relevant problems requiring the combination of micrometer precision with a meter-scale NAR.
Keywords:
LASER
METROLOGY
LIGHT

Journal

Optics Express cover
Optics Express
IF:
3.3
Papers:
6.1W
Citations:
14.3W

Organization

I
institute of microelectronics, cas
Scholars:
884
Papers: 613
Citations: 0
C
chinese academy of sciences
Scholars:
54.9W
Papers: 44.5W
Citations: 703
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