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High-speed atomic force microscopy for materials science
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DOI：10.1080/09506608.2016.1156301.png)
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摘要
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Since its inception in 1986, the field of atomic force microscopy (AFM) has enabled surface analysis and characterisation with unparalleled resolution in a wide variety of environments. However, the technique is limited by very low sample throughput and temporal resolution making it impractical for materials science research on macro sized or time evolving samples such as the observation of corrosion. The potential of AFM sparked intense efforts to overcome these limitations shortly after its invention, and has led to the development of high-speed atomic force microscopes (HS-AFMs). Within the last 5 years the technology underpinning these instruments has matured to the point where routine imaging can achieve megapixels per second over scan areas of square millimetres, removing the limitations from AFM for industrial scale materials characterisation. This review explains the technology and looks to the future use of HS-AFMs in materials science.
Keyword:
Atomic force microscopy
AFM
High-speed AFM
Nanoscale analysis
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