How to optically count graphene layers

Sosan Cheon

doi:10.1364/OL.37.003765

2012-09-05

PRE

DOI：10.1364/OL.37.003765

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摘要

En 中文

The total thickness of a graphene sample depends upon the number of individually stacked graphene layers. The corresponding surface plasmon resonance (SPR) reflectance alters the SPR angle, depending on the number of graphene layers. Thus, the correlation between the SPR angle shift and the number of graphene layers allows for a nonintrusive, real-time, and reliable counting of graphene layers. A single-layer graphene (SLG) is synthesized by means of chemical vapor deposition, followed by physical transfer to a thin gold film (48 nm) repeatedly, so that multilayer graphene samples with one, three, and five layers can be prepared. Both the measured SPR angles and the entire reflectance curve profiles successfully distinguish the number of graphene layers. (C) 2012 Optical Society of America

Keyword:

PLASMON RESONANCE REFLECTANCE

REFRACTIVE-INDEX

FIELD

SPECTROSCOPY

CONSTANTS

METALS

FILMS

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期刊

Optics Letters

IF:

3.3

论文数:

4.0W

被引数:

7.6W

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Yeungnam University

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1.0W

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University of Tennessee Knoxville

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korea electronics technology institute (keti)

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559

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seoul national university (snu)

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7.2W

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