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In-plane electronic speckle pattern shearing interferometry
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DOI：10.1016/0143-8166(95)00139-5.png)
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摘要
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An analysis of the out-of-plane shearing interferometer has been performed which shows that production of in-plane strain partial derivatives is possible, which are not affected by out-of-plane displacement function components. The in-plane data are represented as subtraction correlation fringes. This interferometer employs a single diverging illumination beam and is applicable to object plane stress and plane strain loading conditions. The interferometer was tested and compared using a compact tension crack specimen and the results are correlated with finite element software predictions of strain distributions across modelled specimens. This experimental validation was chosen because we had an existing test rig and finite element models which had been independently verified. Copyright (C) 1996 Elsevier Science Ltd.
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CAMERA
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