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Interferometric phase-dispersion microscopy

delete2000-10-15
delete141
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OA
AI
Y
Yang, CH *
A
Adam Wax
I
Irene Georgakoudi
E
Eugene B. Hanlon
K
Kamran Badizadegan
R
Ramachandra R. Dasari
F
Feld, MS
DOI:10.1364/OL.25.001526delete
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摘要

摘要

En 中文
We describe a new scanning microscopy technique, phase-dispersion microscopy (PDM). The technique is based on measuring the phase difference between the fundamental and the second-harmonic light in a novel interferometer. PDM is highly sensitive to subtle refractive-index differences that are due to dispersion (differential optical path sensitivity, 5 nm). We apply PDM to measure minute amounts of DNA in solution and to study biological tissue sections. We demonstrate that PDM performs better than conventional phase-contrast microscopy in imaging dispersive and weakly scattering samples. (C) 2000 Optical Society of America OCIS codes: 040.2840, 110.0180, 110.4500, 120.5050, 170.3880.
Keyword:
OPTICAL COHERENCE TOMOGRAPHY
TURBID MEDIUM
CONTRAST

期刊

Optics Letters 封面图
Optics Letters
IF:
3.3
论文数:
4.0W
被引数:
7.6W

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