Laser-driven proton sources for efficient radiation testing

Beatrice D’Orsi

doi:10.1038/s41598-025-05682-x

2025-07-26

Beatrice D’Orsi *

Corrado Altomare

A. Ampollini

Maria Denise Astorino

Daniele Salvatore Lazzaro

DOI：10.1038/s41598-025-05682-x

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摘要

En 中文

多个领域，如粒子物理学、太空探索和高能物理学，在强辐射操作环境中使用商业现成（Commercial Off-The-Shelf, COTS）电子元件。这些工作条件可能对电子电路造成显著损害，影响其运行特性，进而影响整个设施的可靠性。对这些元件进行抗辐射认证和表征对于确保其在恶劣条件下的正常运行至关重要。本研究调查了使用不同类型辐射源对高辐射环境中的电子元件进行应力测试的影响。元件分别暴露于伽马射线、激光驱动的质子、常规加速的质子以及中子中，并在不同的辐照条件下分析器件参数。结果表明，由于辐射诱导缺陷，电气性能出现显著退化，且在相同剂量递送下，效应存在显著差异。我们证明，激光驱动的质子辐照能在剂量低两个数量级且速度远快于其他辐射源的情况下实现等效的应力测试，显示出更高的应力测试效率。

Keyword:

Radiation hardness

Transistors

Gamma radiation

Laser-plasma acceleration

Protons

Neutrons

TNSA

TID

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期刊

Scientific Reports

IF:

3.9

论文数:

28.0W

被引数:

83.5W

机构

upmc univ paris 06: sorbonne université

学者数:

论文数: 1

被引数: 0

enea nuclear department

学者数:

论文数: 1

被引数: 0

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