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Loading effects in resistance scaling
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DOI：10.1109/19.571847.png)
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摘要
En 中文
Reference resistors are affected by the heating of the resistor element caused by the measurement current. The effects of such loading are complex and can change in magnitude as a function of the initial state of the resistor and the external environment. This paper describes a method for determining relative load coefficients by using cryogenic current comparator ratio measurements in a two-step scaling process. Previously undiscovered loading effects are analyzed using a resistance element made from copper, which has an easily measured change of resistance with temperature. The magnitude of loading effects in several types of resistors are listed.
期刊
IF:
5.9
论文数:
2.0W
被引数:
5.8W
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