arrow
返回

Low-Energy Single-Electron Detector with Submicron Resolution

delete2025-12-01
delete0
PRE
AI
L
Luis Alfredo Ixquiac Méndez
M
Martino Zanetti
T
Tilman Kraeft
T
Thomas Juffmann *
DOI:10.1021/acsphotonics.5c02404delete
delete原文链接
delete原文求助
delete分享
delete收藏
摘要

摘要

En 中文
Single-electron detectors are a key component of electron microscopes and advanced electron optics experiments. We present a scintillator-based single-electron detector with an estimated spatial resolution of 0.9 mu m at an electron energy of 17 keV. Single-electron detection events are identified with an efficiency and purity larger than 0.8 at an electron energy of 17 keV, reaching 0.96 at 30 keV. We show that the detector enables electron diffraction studies with a sample-detector distance comparable to the mean free path of electrons at atmospheric pressure, potentially enabling atmospheric electron diffraction studies.
Keyword:
Single-electron detection
low-energy electron detector
scintillator-based detector
YAG
Ce scintillator
high-resolution electron detection
electron diffractionat atmospheric pressure
Air-SEM

期刊

ACS Photonics 封面图
ACS Photonics
IF:
6.7
论文数:
5.6K
被引数:
2.5W

机构

U
university of vienna
学者数:
2.9K
论文数: 1.5K
被引数: 0
引用论文

引用论文

Modulated CMOS camera for fluorescence lifetime microscopy
err2015-10-24
err0
errOAAI
errHongtao Chen; Gerhard Holst; Enrico Gratton
err分享
err收藏
Event-Based Vision: A Survey基于事件视觉:一项综述
err2022-01-01
err0
errOAAI
errGuillermo Gallego; Tobi Delbruck; Garrick Orchard; Chiara Bartolozzi; Brian Taba; Andrea Censi; Stefan Leutenegger; Andrew J. Davison; Jorg Conradt; Kostas Daniilidis; Davide Scaramuzza
err分享
err收藏
Timepix4, a large area pixel detector readout chip which can be tiled on 4 sides providing sub-200 ps timestamp binning
err2022-01-12
err0
errOAAI
errX. Llopart; J. Alozy; R. Ballabriga; M. Campbell; R. Casanova; V. Gromov; E.H.M. Heijne; T. Poikela; E. Santin; V. Sriskaran; L. Tlustos; A. Vitkovskiy
err分享
err收藏
Low energy nano diffraction (LEND) – A versatile diffraction technique in SEM
err2020-06-01
err0
PREAI
errPeter Schweizer; Peter Denninger; Christian Dolle; Erdmann Spiecker
err分享
err收藏
Atomically Thin Graphene Windows That Enable High Contrast Electron Microscopy without a Specimen Vacuum Chamber
err2016-11-15
err11
PREAI
errHan, Yimo; Nguyen, Kayla X.; Ogawa, Yui; Park, Jiwoong; Muller, David A.
err分享
err收藏
Transverse Electron-Beam Shaping with Light
err2022-09-26
err26
errOAAI
errMihaila, Marius Constantin Chirita; Weber, Philipp; Schneller, Matthias; Grandits, Lucas; Nimmrichter, Stefan; Juffmann, Thomas
err分享
err收藏
学者 查看更多内容