返回
Machine learning at the (sub)atomic scale: next generation scanning probe microscopy
DOI:10.1088/2632-2153/ab7d2f.png)
摘要
En 中文
We discuss the exciting prospects for a step change in our ability to map and modify matter at the atomic/molecular level by embedding machine learning algorithms in scanning probe microscopy (with a particular focus on scanning tunnelling microscopy, STM). This nano-AI hybrid approach has the far-reaching potential to realise a technology capable of the automated analysis, actuation, and assembly of matter with a precision down to the single chemical bond limit.
Keyword:
CNNs
automated SPM
SPM state recognition
期刊
M
IF:
4.6
论文数:
1.1K
被引数:
3.4K
机构
引用论文
Correlated Materials Characterization via Multimodal Chemical and Functional Imaging通过多模态化学和功能成像进行相关材料表征
ACS NANO
IF16

