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期刊

Microscopy and Microanalysis 封面图
Microscopy and Microanalysis
IF:
3
论文数:
2.5K
被引数:
6.2K

机构

N
national institute of standards and technology
学者数:
560
论文数: 219
被引数: 0
引用论文

引用论文

err
IF0
err
err0
PREAI
err
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Investigation of the charge on threading edge dislocations in GaN by electron holography
errJournal of Electron Microscopy
IF0
err2002-04-15
err0
PREAI
errC. Jiao
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Threading dislocations in GaN high-voltage switchesGaN高压开关中的位错线
errMicroelectronics Reliability
IF0
err2021-09-01
err0
errOAAI
errBrett Setera; Aristos Christou
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Electron scattering due to threading edge dislocations in n-type wurtzite GaN
errJournal of Applied Physics
IF0
err2006-02-09
err0
PREAI
errJeong Ho You; Jun-Qiang Lu; H. T. Johnson
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Probing the electrostatic potential of charged dislocations in n-GaN and n-ZnO epilayers by transmission electron holography
errPHYSICAL REVIEW B
IF3.7
err2006-06-14
err64
PREAI
errMueller, E.; Gerthsen, D.; Brueckner, P.; Scholz, F.; Gruber, Th.; Waag, A.
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