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Measuring relatedness between technological fields

delete2009-11-19
delete46
PRE
AI
S
Si Hyung Joo
Y
Yeonbae Kim *
DOI:10.1007/s11192-009-0108-9delete
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摘要

摘要

En 中文
Intensified technology convergence, increasing relatedness between technological fields, is a mega-trend in 21st century science and technology. However, scientometrics has been unsuccessful in identifying this techno-economic paradigm change. To address the limitations and validity problems of conventional measures of technology convergence, we introduce a multi-dimensional contingency table representation of technological field co-occurrence and a relatedness measure based on the Mantel-Haenszel common log odds ratio. We used Korean patent data to compare previous and proposed methods. Results show that the proposed method can increase understanding of the techno-economic paradigm change because it reveals significant changes in technological relatedness over time.
Keyword:
Relatedness
IPC co-occurrence
Incomplete multi-dimensional contingency table
Mantel-Haenszel common odds ratio

期刊

Scientometrics 封面图
Scientometrics
IF:
3.5
论文数:
8.1K
被引数:
2.2W

机构

S
seoul national university (snu)
学者数:
7.2W
论文数: 6.6W
被引数: 86
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