Measuring Temperature-Induced Strain Changes using Transmission Kikuchi Diffraction

Yueyun Chen

doi:10.1093/mam/ozag053.205

2026-07-27

Matthew Mecklenburg *

DOI：10.1093/mam/ozag053.205

原文链接

原文求助

摘要

期刊

Microscopy and Microanalysis

IF:

论文数:

2.5K

被引数:

6.2K

机构

university of california

学者数:

2.5K

论文数: 870

被引数: 0

引用论文

A novel nano-scale non-contact temperature measurement technique for crystalline materials

Nanotechnology

IF0

2012-10-23

PREAI

Xiaowei Wu; Robert Hull

Scattering angle dependence of temperature susceptivity of electron scattering in scanning transmission electron microscopy 扫描透射电子显微镜中电子散射温度敏感性的散射角依赖性

Ultramicroscopy

IF0

2022-01-01

OAAI

Menglin Zhu; Jinwoo Hwang

Nanoscale temperature mapping in operating microelectronic devices

Science

IF0

2015-02-06

OAAI

Matthew Mecklenburg; William A. Hubbard; E. R. White; Rohan Dhall; Stephen B. Cronin; Shaul Aloni; B. C. Regan

Noncontact thermometry based on direct electron detection of electron-backscattering diffraction patterns 基于电子背散射衍射花样直接电子探测的非接触式热成像技术

Physical Review Applied

IF0

PREAI

Gnabasik,Ryan; Nughays,Razan O.; Overholser,Ashlynn; Lin,Tong; Kumar,Vijay; Adajian,Shantal; della Ventura,Nicolò Maria; Gu,Mengyang; Gianola,Daniel S.; Liao,Bolin

IF0

PREAI