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Metasurface-Based Mueller Matrix Microscope
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DOI：10.1002/adfm.202405412.png)
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Abstract
En 中文
In conventional optical microscopes, image contrast of objects mainly results from the differences in light intensity and/or color. Muller matrix optical microscopes (MMMs), on the other hand, can provide significantly enhanced image contrast and rich information about objects by analyzing their interactions with polarized light. However, state-of-the-art MMMs are fundamentally limited by bulky and slow polarization state generators and analyzers. Here, the study demonstrates a metasurface-based MMM, i.e., Meta-MMM, which is equipped with a chip-integrated, single-shot metasurface polarization state analyzer (Meta-PSA). The Meta-MMM is featured with high-speed measurement (approximate to 2s per Muller matrix (MM) image), superior operation stability, dual-color operation, and high measurement accuracy (measurement error 1-2%) for MM imaging. The Meta-MMM is applied to nanostructure characterization, surface morphology analysis, and discovering birefringent structures in honeybee wings. The Meta-MMMs hold the promise to revolutionize various applications from biological imaging, medical diagnosis, and material characterization to industry inspection and space exploration. A metasurface-based Muller matrix microscope (Meta-MMM) is presented, which is equipped with a chip-integrated, single-shot metasurface polarization state analyzer (Meta-PSA). The Meta-MMM is featured with high-speed (approximate to 2s per MM image), superior operation stability, dual-color operation, and high measurement accuracy (measurement error 1-2%). Applications including nanostructure characterization, surface morphology analysis, and biology study are presented. image
Keywords:
metasurface
Mueller matrix microscopy
polarization microscopy
Journal
IF:
19
Papers:
3.4W
Citations:
32.1W