arrow
返回

MRD-Net: An Effective CNN-Based Segmentation Network for Surface Defect Detection

delete2022-01-01
delete17
PRE
AI
P
Pengwen Lu
景
景军锋 (Junfeng Jing) *
DOI:10.1109/TIM.2022.3200361delete
delete原文链接
delete原文求助
delete分享
delete收藏
摘要

摘要

En 中文
Surface defect detection is a crucial component in industrial production. Many algorithms based on computer vision have been successfully applied to surface defect detection, but several problems need to be solved in practical implementation. First, surface defects of different products are diverse in shape, size, and location, which pose a challenge to the generalizability and accuracy of the algorithm. Second, the algorithm is required to be real time in practical detection. To address these problems, we propose a multiscale feature enhancement fusion (MFEF) and reverse attention (RA) network for surface defect detection, named MRD-Net, to achieve real-time and end-to-end defect segmentation. The framework first extracts multiscale feature maps from the pretrained MobileNetV2. Then, the MFEF module is proposed to enhance and fuse the feature maps of the deeper layers in the backbone to improve the detection performance. Through several skip connections, the adjacent branches are connected top-down. The RA module is applied in shallow branches to utilize deeper prediction information. Finally, the boundary refinement module is added to refine the object boundary and improve prediction accuracy. Our proposed method requires only a small number of defective samples and achieves a high detection accuracy. The experimental results on three datasets (14 industrial products) show that the proposed method outperforms the three state-of-the-art segmentation methods in terms of generalizability and accuracy, and it also achieves the requirement of real-time detection with a speed of 52 FPS for a 352 x 352 image.
Keyword:
Deep learning
multiscale features
reverse attention (RA)
segmentation network
surface defect detection

期刊

IEEE Transactions on Instrumentation and Measurement 封面图
IEEE Transactions on Instrumentation and Measurement
IF:
5.9
论文数:
2.0W
被引数:
5.8W

机构

暂无机构信息
引用论文

引用论文

A tutorial on the cross-entropy method关于交叉熵方法的教程
err2005-02-01
err2.2K
PREAI
errDe Boer, PT; Kroese, DP; Mannor, S; Rubinstein, RY
err分享
err收藏
Electrochemically assisted micro localized grafting of aptamers in a microchannel engraved in fluorinated thermoplastic polymer Dyneon THV
err2015-01-01
err0
PREAI
errC. Perréard; Y. Ladner; F. d'Orlyé; S. Descroix; V. Taniga; A. Varenne; F. Kanoufi; C. Slim; S. Griveau; F. Bedioui
err分享
err收藏
学者 查看更多内容