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(Multi)functional Atomic Force Microscopy Imaging

delete2018-06-12
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PRE
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A
Anisha N. Patel
C
Christine Kranz *
DOI:10.1146/annurev-anchem-061417-125716delete
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摘要

摘要

En 中文
Incorporating functionality to atomic force microscopy (AFM) to obtain physical and chemical information has always been a strong focus in AFM research. Modifying AFM probes with specific molecules permits accessibility of chemical information via specific reactions and interactions. Fundamental understanding of molecular processes at the solid/liquid interface with high spatial resolution is essential to many emerging research areas. Nanoscale electrochemical imaging has emerged as a complementary technique to advanced AFM techniques, providing information on electrochemical interfacial processes. While this review presents a brief introduction to advanced AFM imaging modes, such as multiparametric AFM and topography recognition imaging, the main focus herein is on electrochemical imaging via hybrid AFM-scanning electrochemical microscopy. Recent applications and the challenges associated with such nanoelectrochemical imaging strategies are presented.
Keyword:
multiparametric AFM
molecular recognition imaging
AFM probe modification
atomic force microscopy-scanning electrochemical microscopy
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期刊

Annual Review of Analytical Chemistry 封面图
Annual Review of Analytical Chemistry
IF:
7.5
论文数:
394
被引数:
3.1K

机构

U
ulm university
学者数:
303
论文数: 109
被引数: 2.0K
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