arrow
返回

Multiscale 3D X-ray imaging

delete2019-10-15
delete3
PRE
AI
R
R. Joseph Kline *
DOI:10.1038/s41928-019-0320-4delete
delete原文链接
delete原文求助
delete分享
delete收藏
摘要

摘要

En 中文
A technique known as ptychographic X-ray laminography can image integrated circuits over large volumes and with a resolution of around 10 nm.
AI总结

AI总结

对已上传原文的论文进行重点信息的提取,主要内容包括:简要概述、研究摘要、背景介绍、关键亮点、图文解析、展望与总结。

期刊

Nature Electronics 封面图
Nature Electronics
IF:
40.9
论文数:
1.7K
被引数:
2.1W

机构

N
national institute of standards & technology (nist) - usa
学者数:
9.7K
论文数: 9.0K
被引数: 4
引用论文

引用论文

The next ten years of X-ray science
err2017-01-03
err79
PREAI
errYabashi, Makina; Tanaka, Hitoshi
err分享
err收藏
X-ray ptychographyX射线照相术
err2017-12-22
err489
PREAI
errPfeiffer, Franz
err分享
err收藏
Three-dimensional imaging of integrated circuits with macro- to nanoscale zoom
err2019-10-07
err110
errOAAI
errHoller, Mirko; Odstrcil, Michal; Guizar-Sicairos, Manuel; Lebugle, Maxime; Mueller, Elisabeth; Finizio, Simone; Tinti, Gemma; David, Christian; Zusman, Joshua; Unglaub, Walter; Bunk, Oliver; Raabe, Joerg; Levi, A. F. J.; Aeppli, Gabriel
err分享
err收藏
High-resolution non-destructive three-dimensional imaging of integrated circuits
err2017-03-15
err0
PREAI
errMirko Holler; Manuel Guizar-Sicairos; Esther H. R. Tsai; Roberto Dinapoli; Elisabeth Müller; Oliver Bunk; Jörg Raabe; Gabriel Aeppli
err分享
err收藏
An inverse free electron laser acceleration-driven Compton scattering X-ray source
err2019-01-24
err23
errOAAI
errGadjev, I.; Sudar, N.; Babzien, M.; Duris, J.; Hoang, P.; Fedurin, M.; Kusche, K.; Malone, R.; Musumeci, P.; Palmer, M.; Pogorelsky, I.; Polyanskiy, M.; Sakai, Y.; Swinson, C.; Williams, O.; Rosenzweig, J. B.
err分享
err收藏
没有更多内容