New program with new approach for spectral data analysis

Sochi, Taha

doi:10.1016/j.measurement.2013.06.053

2013-11-01

Sochi, Taha *

DOI：10.1016/j.measurement.2013.06.053

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摘要

En 中文

This article presents a high-throughput computer program, called EasyDD, for batch processing, analyzing and visualizing of spectral data; particularly those related to the new generation of synchrotron detectors and X-ray powder diffraction applications. This computing tool is designed for the treatment of large volumes of data in reasonable time with affordable computational resources. A case study in which this program was used to process and analyze powder diffraction data obtained from the ESRF synchrotron on an alumina-based nickel nanoparticle catalysis system is also presented for demonstration. The development of this computing tool, with the associated protocols, is inspired by a novel approach in spectral data analysis. (c) 2013 Elsevier Ltd. All rights reserved.

Keyword:

Spectral analysis

Synchrotron

X-ray

Powder diffraction

High-throughput software

Tomographic imaging

Multi-TEDDI detector

Alumina-based catalyst

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期刊

Measurement

IF:

5.6

论文数:

2.1W

被引数:

5.4W

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