Optical coherence tomography using a frequency-tunable optical source

Chinn, SR

doi:10.1364/OL.22.000340

1997-03-01

827

PRE

Chinn, SR *

Swanson, EA

James G. Fujimoto

DOI：10.1364/OL.22.000340

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摘要

En 中文

We have developed a simple, wide-optical-bandwidth, high-resolution system for per for ming rapid optical frequency domain reflectometry measurements and applied it to multidimensional tomographic imaging. The source is a grating-tuned external cavity semiconductor laser with a tuning capability of 25 nm in 100 ms. We discuss system performance and show a two-dimensional optical coherence tomography image of a thin glass sandwich structure as a preliminary demonstration of the systems depth and resolution capabilities. (C) 1997 Optical Society of America.

Keyword:

DOMAIN REFLECTOMETRY

SEMICONDUCTOR-LASER

FMCW REFLECTOMETRY

EXTERNAL-CAVITY

RESOLUTION

COMPONENTS

SYSTEMS

OFDR

期刊

Optics Letters

IF:

3.3

论文数:

4.0W

被引数:

7.6W

机构

暂无机构信息

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