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Optimal selective Huffman coding for test-data compression
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DOI：10.1109/TC.2007.1057.png)
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Selective Huffman coding has recently been proposed for efficient test-data compression with low hardware overhead. In this paper, we show that the already proposed encoding scheme is not optimal and we present a new one, proving that it is optimal. Moreover, we compare the two encodings theoretically and we derive a set of conditions which show that, in practical cases, the proposed encoding always offers better compression. In terms of hardware overhead, the new scheme is at least as low-demanding as the old one. The increased compression efficiency, the resulting test-time savings, and the low hardware overhead of the proposed method are also verified experimentally.
Keyword:
embedded testing techniques
IP cores
selective Huffman coding
test-data compression
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3.8
论文数:
5.4K
被引数:
9.8K
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