Optimum frequency selection in multifrequency interferometry

doi:10.1364/OL.28.000887

2003-06-01

181

PRE

Catherine E. Towers *

David P. Towers

DOI：10.1364/OL.28.000887

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摘要

En 中文

We describe a novel technique for measurement of absolute order of interference in multifrequency interferometry. An optimization criterion is introduced that leads to frequency selection formulations that are optimized with respect to the minimum number of frequencies required for achieving the maximum target dynamic range. The method is generalized to N frequencies and gives a definition of measurement reliability. We demonstrate the technique by means of coherent fringe projection for nonintrusive, full-field profilometry. Experimental data for three frequencies are presented. (C) 2003 Optical Society of America.

Keyword:

SHAPE MEASUREMENT

SURFACE FORM

PHASE

期刊

Optics Letters

IF:

3.3

论文数:

4.0W

被引数:

7.6W

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暂无机构信息

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