arrow
返回

Pattern classification using smallest normalized difference associative memory

delete2017-07-01
delete21
PRE
AI
R
Rogelio Ramírez-Rubio
M
Mario Aldape-Pérez *
C
Cornelio Yáñez-Márquéz
I
Itzamá López-Yáñez
O
Oscar Camacho-Nieto
DOI:10.1016/j.patrec.2017.02.013delete
delete原文链接
delete原文求助
delete分享
delete收藏
摘要

摘要

En 中文
In this paper a new associative classification algorithm is presented. The proposed algorithm overcomes the limitations of the original Alpha-Beta associative memory, while maintaining the fundamental set recalling capacity. This algorithm has two phases. The first phase is based on an Alpha-Beta auto-associative memory, which works in the domain of real numbers, unlike the traditional Alpha-Beta associative memories. In the second phase, normalized difference between the results of first phase and every pattern of the fundamental set is calculated. In order to demonstrate the behaviour and accuracy of the algorithm, multiple well known datasets and classification algorithms have been used. Experimental results have shown that our proposal achieved the best performance in three of the eight pattern classification problems in the medical field, using Stratified 10 Fold cross-validation. Our proposal achieved the best classification accuracy averaged over the all datasets addressed in the present work. Experimental results and statistical significance tests, allow us to affirm that the proposed model is an efficient alternative to perform pattern classification tasks. (C) 2017 Elsevier B.V. All rights reserved.
Keyword:
Associative memories
Decision support systems
Pattern classification
Hybrid algorithms
Supervised machine learning
AI总结

AI总结

对已上传原文的论文进行重点信息的提取,主要内容包括:简要概述、研究摘要、背景介绍、关键亮点、图文解析、展望与总结。

期刊

Pattern Recognition Letters 封面图
Pattern Recognition Letters
IF:
3.3
论文数:
7.9K
被引数:
1.6W

机构

I
instituto politecnico nacional - mexico
学者数:
1.6W
论文数: 1.0W
被引数: 3
引用论文

引用论文

err分享
err收藏
Effect of the electrical double layer on voltammetry at microelectrodes
err2002-05-01
err0
PREAI
errJohn D. Norton; Henry S. White; Stephen W. Feldberg
err分享
err收藏
Bagging predictorsBagging预测器
err1996-08-01
err1.0W
PREAI
errBreiman, L
err分享
err收藏
学者 查看更多内容