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Predicting and Accelerating Nanomaterial Synthesis Using Machine Learning Featurization

delete2024-11-12
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PRE
AI
C
Christopher C. Price
李岩松 封面图
李岩松 (Yansong Li)
周
周光明 (Guanyu Zhou)
R
Rehan Younas
S
Siyang Zeng
S
Scanlon, Tim H.
J
Jason M. Munro *
C
Christopher L. Hinkle *
DOI:10.1021/acs.nanolett.4c04500delete
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摘要

摘要

En 中文
Materials synthesis optimization is constrained by serial feedback processes that rely on manual tools and intuition across multiple siloed modes of characterization. We automate and generalize feature extraction of reflection high-energy electron diffraction (RHEED) data with machine learning to establish quantitatively predictive relationships in small sets (similar to 10) of expert-labeled data, saving significant time on subsequently grown samples. These predictive relationships are evaluated in a representative material system (W1-x V x Se2 on c-plane sapphire (0001)) with two aims: 1) predicting grain alignment of the deposited film using pregrowth substrate data and 2) estimating vanadium dopant concentration using in situ RHEED as a proxy for ex situ methods (e.g., X-ray photoelectron spectroscopy). Both tasks are accomplished using the same materials-agnostic features, avoiding specific system retraining and leading to a potential 80% time saving over a 100-sample synthesis campaign. These predictions provide guidance to avoid doomed trials, reduce follow-on characterization, and improve control resolution for materials synthesis.
Keyword:
Machine Learning
Epitaxial Growth
2D Materials
Electron Diffraction
Synthesis Control

期刊

Nano Letters 封面图
Nano Letters
IF:
9.1
论文数:
2.7W
被引数:
16.5W

机构

U
University of Notre Dame
学者数:
1.2W
论文数: 1.1W
被引数: 1.7W
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