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Quantitative atom-resolved force gradient imaging using noncontact atomic force microscopy

delete2001-09-17
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PRE
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A
Ahmet Oral *
R
Ralph A. Grimble
H
H. Özgür Özer
P
Peter M. Hoffmann
J
J. B. Pethica
DOI:10.1063/1.1389785delete
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摘要

摘要

En 中文
Quantitative force gradient images are obtained using a sub-angstrom amplitude, off-resonance lever oscillation method during scanning tunneling microscopy imaging. We report the direct observation of short-range bonds, and the measured short-range force interaction agrees well in magnitude and length scale with theoretical predictions for single bonds. Atomic resolution is shown to be associated with the presence of a prominent short-range contribution to the total force interaction. It is shown that the background longer-range interaction, whose relative magnitude depends on the tip structure, has a significant effect on the contrast observed at the atomic scale. (C) 2001 American Institute of Physics.
Keyword:
SCANNING-TUNNELING-MICROSCOPY
REACTIVE SURFACES
TIP
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期刊

Applied Physics Letters 封面图
Applied Physics Letters
IF:
3.6
论文数:
10.4W
被引数:
17.8W

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