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Quantum certification and benchmarking
DOI:10.1038/s42254-020-0186-4.png)
摘要
En 中文
With the rapid development of quantum technologies, a pressing need has emerged for a wide array of tools for the certification and characterization of quantum devices. Such tools are critical because the powerful applications of quantum information science will only be realized if stringent levels of precision of components can be reached and their functioning guaranteed. This Technical Review provides a brief overview of the known characterization methods for certification, benchmarking and tomographic reconstruction of quantum states and processes, and outlines their applications in quantum computing, simulation and communication. Quantum technologies require an extremely precise functioning of their components which is ensured by sophisticated tools for device characterization. This Technical Review surveys and assesses the currently available tools according to their overall complexity, information gain, and underlying assumptions.
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期刊
IF:
39.5
论文数:
401
被引数:
1.3W
机构
引用论文
On the experimental verification of quantum complexity in linear optics关于线性光学中量子复杂性的实验验证
NATURE PHOTONICS
IF32.9

