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Reliable and Lightweight Adaptive Convolution Network for PCB Surface Defect Detection

delete2024-01-01
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PRE
AI
L
Lei Lei
H
Han‐Xiong Li *
杨
杨海东 (Haidong Yang)
DOI:10.1109/TIM.2024.3381700delete
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摘要

摘要

En 中文
Surface defect detection is very important for the printed circuit board (PCB) to ensure their quality requirements. This article proposes a reliable and lightweight adaptive convolution (LAC) network for PCB surface defect detection. First, an automated optical inspection (AOI) for collecting PCB defects is introduced, and the formation mechanism of PCB defects is systematically analyzed. After that, LAC strategically aggregates multiple convolution kernels and simplifies model complexity through tensor decomposition. Furthermore, the confidence gate learning (CGL) strategy aims to cope with dataset noise by combining collaborative learning (CL) and confidence evaluation. Complexity and convergence analyses support the theoretical basis of the method. Finally, three industrial defect datasets are used to evaluate the effectiveness. The results show that the methodology has powerful feature representation, visual interpretability, and detection robustness.
Keyword:
Convolution
Printed circuits
Kernel
Feature extraction
Defect detection
Adaptation models
Adaptive systems
Confidence evaluation
convolutional neural network (CNN)
dataset noise
defect detection
printed circuit board (PCB)

期刊

IEEE Transactions on Instrumentation and Measurement 封面图
IEEE Transactions on Instrumentation and Measurement
IF:
5.9
论文数:
2.0W
被引数:
5.8W

机构

C
City University of Hong Kong
学者数:
2.3W
论文数: 3.0W
被引数: 6.1W
G
guangdong university of technology
学者数:
3.0W
论文数: 2.0W
被引数: 36
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