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Self-probed ptychography from semiconductor high-harmonic generation
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DOI：10.1364/OL.471113.png)
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We demonstrate a method to image an object using a self -probing approach based on semiconductor high-harmonic generation. On the one hand, ptychography enables high -resolution imaging from the coherent light diffracted by an object. On the other hand, high-harmonic generation from crystals is emerging as a new source of extreme-ultraviolet ultrafast coherent light. We combine these two techniques by performing ptychography measurements with nanopat-terned crystals serving as the object as well as the generation medium of the harmonics. We demonstrate that this strong field in situ approach can provide structural information about an object. With the future developments of crystal high harmonics as a compact short-wavelength light source, our demonstration can be an innovative approach for nanoscale imaging of photonic and electronic devices in research and industry.(c) 2022 Optica Publishing Group generated ture sensitivity be phase that first phase technique wavelength. extended terns Image the patterns
期刊
IF:
3.3
论文数:
4.0W
被引数:
7.6W
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引用论文
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