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Shape-optimized electrooptic beam scanners: Analysis, design, and simulation

delete1999-01-01
delete53
PRE
AI
Y
Yi Chiu
J
Jie Zou
D
Daniel D. Stancil
T
T. E. Schlesinger
DOI:10.1109/50.737429delete
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摘要

摘要

En 中文
This paper presents the analysis of a general nonrectangular electrooptic (EO) scanner and compare its performance to a rectangular device. Since the scanning sensitivity of an EO scanner is inversely proportional to its width, high sensitivity requires the device contour to be close to the ray trajectory of a beam propagating through the device, Accordingly, a shaped-optimized scanner is designed so that the beam trajectory at maximum deflection is parallel to the device contour, A beam propagation method (BPM) simulation shows the performance agrees well with the analysis.
Keyword:
BPM simulation
electrooptic (EO) scanner
ray equation
ray tracing
scanning sensitivity

期刊

Journal of Lightwave Technology 封面图
Journal of Lightwave Technology
IF:
4.8
论文数:
1.7W
被引数:
3.8W

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暂无机构信息
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