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Small-amplitude atomic force microscopy
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DOI：10.1002/adem.200500054.png)
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Small amplitude Atomic Force Microscopy (AFM) is a relatively new AFM technique which was specifically developed to perform linear measurements of nanomechanical phenomena. This is achieved by using ultra-small cantilever amplitudes and very high sensitivity deflection sensors. Recently this technique has been used in ultra-high vacuum (UHV) and liquid environments to measure atomic and molecular forces and dynamics with high precision. Here we focus on three examples which are interesting from a nanoengineering standpoint: Atomic energy dissipation (atomic friction), atomic-scale contact mechanics, and nanotribology/molecular ordering in confined liquid films.
Keyword:
FREQUENCY-SHIFT
TIP
RESOLUTION
DYNAMICS
SPECTROSCOPY
GRAPHITE
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Conservative and dissipative tip-sample interaction forces probed with dynamic AFM.png)
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