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SMUP: A technique to improve MC/DC using specified patterns

delete2024-12-01
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PRE
AI
S
Swadhin Kumar Barisal *
A
Arpita Dutta
S
Sangharatna Godboley
B
Bibhudatta Sahoo
D
Durga Prasad Mohapatra
DOI:10.1016/j.compeleceng.2024.109706delete
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摘要

摘要

En 中文
According to recent study, a number of poorly explored aspects, like program structure and not producing high-quality random inputs for testing, can have a significant impact on the overall efficacy of the testing process. Existing concolic testers found to be more cost-effective than random testers for code coverage. Modified condition/decision coverage (MC/DC) has gained its popularity as the strongest criterion for safety-critical systems proposed by RTCA/DO178B(C), after multiple condition coverage (MCC). This paper proposes a new source code transformation technique that produces additional test cases to achieve higher MC/DC. The technical contribution of this work is threefold. First, it uses a pattern-based code transformation technique that produces effective MC/DC test cases. This pattern-based approach guides the concolic tester to generate test cases as per the MC/DC requirements. Second, the generated patterns are further simplified to minimize the execution time. Third, we have developed a tool named Java MC/DC Analyzerto measure MC/DC score for the input programs. The proposed approach is experimented on thirty Java programs and achieved an average increase of 32.86% MC/DC score which validates our work. Also, we have compared our approach with other code transformation techniques and reported a significant improvement.
Keyword:
Software testing
Program analysis
MC/DC
MCC
Patterns
CONCOLIC testing
Code transformation
Safety-critical systems

期刊

C
Computers and Electrical Engineering
IF:
4.9
论文数:
6.7K
被引数:
1.3W

机构

N
national institute of technology (nit system)
学者数:
4.0W
论文数: 3.7W
被引数: 31
N
National Institute of Technology Rourkela
学者数:
2.3K
论文数: 2.1K
被引数: 4.8K
N
National University of Singapore
学者数:
7.6W
论文数: 6.5W
被引数: 11.4W
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