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Soft Error Resilience in Chip Multiprocessor Cache using a Markov Model based Re-usability Predictor

delete2019-11-01
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Avishek Choudhury *
B
Biplab K. Sikdar
DOI:10.1109/ICCD46524.2019.00072delete
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摘要

摘要

En 中文
Power consumption in the dense chip multiprocessors restricts the operational life of the battery operated devices. Voltage scaling for ensuring longer battery life exhibits hard and soft errors in cache. Hard faults, early detectable at boot time, are tractable but soft errors, being unpredictable in nature, are indeed hard to handle. Error correcting codes for soft error mitigation perform effectively for single event upsets (SEUs) but future technology nodes are anticipated to have significant multi bit upsets (MBUs) due to miniaturization which demands additional system level protection. Several redundancy based schemes have been proposed but none of them reported any scalable solution for shared NUCA cache in multicore and suffered from either low coverage due to partial redundancy or performance degradation due to capacity loss in full coverage. This work addresses both these issues by ensuring full error coverage with minimum cache bypass. Errors are detected using simple error detection technique like CRC and the dirty as well as reusable clean words are replicated either locally in same tile or globally to remote tiles to ensure complete error coverage. Word re-usability is calculated using a Markov Chain based novel re-usability prediction mechanism by analysing the cache access pattern. An invalidation strategy is applied that invalidates non-reusable words for reducing the vulnerable time to soft errors. A re-usability aware replacement policy is also designed that replaces the line with lowest re-usability, calculated at line level. The proposed technique has been evaluated in Multi2Sim 5.0 simulation framework with the benchmark programs in SPEC CPU2000 suite. The results indicate on average 83.33% decrease of vulnerability for integer benchmarks and 87.09% for floating point benchmarks, with full multi-bit error coverage, at the cost of 4.99% area, 5.54% dynamic power and 6.55% leakage power overheads with negligible performance penalty.
Keyword:
Chip Multiprocessor
Cache
Soft Error
Reusability
Markov Model
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期刊

I
IEEE International Conference on Computer Design
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论文数:
14
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机构

U
University of Calcutta
学者数:
4.5K
论文数: 4.2K
被引数: 3.6K
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