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Study on generalized analysis model for fringe pattern profilometry

delete2008-01-01
delete16
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OA
AI
Y
Yingsong Hu *
J
Jiangtao Xi
Z
Zongkai Yang
E
Enbang Li
J
J.F. Chicharo
DOI:10.1109/TIM.2007.909417delete
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摘要

摘要

En 中文
This paper presents a generalized analysis model for fringe pattern profilometry. We mathematically derived a new analysis model that gives a more general expression of the relationship between projected and deformed fringe patterns. Meanwhile, based on the proposed generalized model, a new algorithm is presented to retrieve 3-D surfaces from nonlinearly distorted fringes. Without any prior knowledge about the projection system, we still can obtain very accurate measurement results by using a generalized analysis model and a proposed algorithm. Computer simulation and experimental results show that the generalized model and the proposed algorithm can significantly improve the 3-D reconstruction precision, especially when the projected fringe pattern is nonlinearly distorted.
Keyword:
fourier transform profilometry (FTP)
fringe pattern analysis
fringe pattern profilometry (FPP)
generalized analysis model
shift estimation (SE)

期刊

IEEE Transactions on Instrumentation and Measurement 封面图
IEEE Transactions on Instrumentation and Measurement
IF:
5.9
论文数:
1.9W
被引数:
5.8W

机构

T
tianjin university
学者数:
8.0W
论文数: 5.8W
被引数: 88
U
University of Wollongong
学者数:
1.3W
论文数: 1.6W
被引数: 2.8W
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