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Super resolution imaging achieved by using on-axis interferometry based on a Spatial Light Modulator
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DOI：10.1364/OE.21.009615.png)
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Abstract
En 中文
An interferometry based method to achieve resolution beyond the diffraction barrier is proposed. Object is illuminated with different tilted beams, generated by using a Spatial Light Modulator (SLM). In addition, some constant phases are also assigned to each tilted beam with the SLM display. Then, the object is simultaneously illuminated with all tilted beams, producing an on-axis interferometry scheme. An interferogram at the image plane is formed for each set of constant phases added to the tilted beams. Using proper selection of constant phases for each of the interferograms, the synthetic aperture can be calculated. During the post processing, we take the Fourier transforms of the each image and the portions of the spectrum are spatially shifted and combined to obtain synthesized spectrum whose inverse Fourier transform gives high resolution image. (C) 2013 Optical Society of America
Keywords:
STRUCTURED ILLUMINATION
OPTICAL-SYSTEMS
SUPERRESOLUTION
MICROSCOPY
HOLOGRAPHY
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