arrow
返回

Texture Classification Using Refined Histogram

delete2010-05-01
delete40
PRE
AI
L
Lizao Li *
C
C.S. Tong
S
Siu Kai Choy
DOI:10.1109/TIP.2010.2041414delete
delete原文链接
delete原文求助
delete分享
delete收藏
摘要

摘要

En 中文
In this correspondence, we propose a novel, efficient, and effective Refined Histogram (RH) for modeling the wavelet subband detail coefficients and present a new image signature based on the RH model for supervised texture classification. Our RH makes use of a step function with exponentially increasing intervals to model the histogram of detail coefficients, and the concatenation of the RH model parameters for all wavelet subbands forms the so-called RH signature. To justify the usefulness of the RH signature, we discuss and investigate some of its statistical properties. These properties would clarify the sufficiency of the signature to characterize the wavelet subband information. In addition, we shall also present an efficient RH signature extraction algorithm based on the coefficient-counting technique, which helps to speed up the overall classification system performance. We apply the RH signature to texture classification using the well-known databases. Experimental results show that our proposed RH signature in conjunction with the use of symmetrized Kullback -Leibler divergence gives a satisfactory classification performance compared with the current state-of-the-art methods.
Keyword:
Histogram
statistical modeling
texture classification
AI总结

AI总结

对已上传原文的论文进行重点信息的提取,主要内容包括:简要概述、研究摘要、背景介绍、关键亮点、图文解析、展望与总结。

期刊

IEEE Transactions on Image Processing 封面图
IEEE Transactions on Image Processing
IF:
13.7
论文数:
1.0W
被引数:
8.4W

机构

H
Hong Kong Baptist University
学者数:
6.3K
论文数: 7.5K
被引数: 1.3W
引用论文

引用论文

err分享
err收藏
Statistical analysis of chromatid interference.
err1995-02-01
err0
errOAAI
errH Zhao; M S McPeek; T P Speed
err分享
err收藏
Nanocrystalline silicon films as multifunctional material for optoelectronic and photovoltaic applications纳米硅薄膜作为光电和光伏应用的多功能材料
err2006-10-01
err0
PREAI
errS. Pizzini; M. Acciarri; S. Binetti; D. Cavalcoli; A. Cavallini; D. Chrastina; L. Colombo; E. Grilli; G. Isella; M. Lancin; A. Le Donne; A. Mattoni; K. Peter; B. Pichaud; E. Poliani; M. Rossi; S. Sanguinetti; M. Texier; H. von Känel
err分享
err收藏
err分享
err收藏
学者 查看更多内容