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Tight focusing with a binary microaxicon
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DOI：10.1364/OL.36.003100.png)
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Using a near-field scanning microscope (NT-MDT) with a 100 nm aperture cantilever held 1 mu m apart from a microaxicon of diameter 14 mu m and period 800 nm, we measure a focal spot resulting from the illumination by a linearly polarized laser light of wavelength lambda = 532 nm, with its FWHM being equal to 0.58 lambda, and the depth of focus being 5.6 lambda. The rms deviation of the focal spot intensity from the calculated value is 6%. The focus intensity is five times larger than the maximal illumination beam intensity. (C) 2011 Optical Society of America
Keyword:
POLARIZED BEAM
BESSEL BEAM
MICROSCOPY
NEEDLE
AXICON
DEPTH
FIELD
期刊
IF:
3.3
论文数:
4.0W
被引数:
7.6W
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