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Tip-enhanced photoluminescence nano-spectroscopy and nano-imaging

delete2020-06-03
delete71
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OA
AI
H
Hyeongwoo Lee
D
Dong Yun Lee
M
Min Gu Kang
Y
Yeonjeong Koo
T
Tae-Hyun Kim
K
Kyoung‐Duck Park *
DOI:10.1515/nanoph-2020-0079delete
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Abstract

Abstract

En 中文
Photoluminescence (PL), a photo-excited spontaneous emission process, provides a wealth of optical and electronic properties of materials, which enable microscopic and spectroscopic imaging, biomedical sensing and diagnosis, and a range of photonic device applications. However, conventional far-field PL measurements have limitations in sensitivity and spatial resolution, especially to investigate single nano-materials or nano-scale dimension of them. In contrast, tip-enhanced photoluminescence (TEPL) nano-spectroscopy provides an extremely high sensitivity with <10 nm spatial resolution, which allows the desired nano-scale characterizations. With outstanding and unique optical properties, low-dimensional quantum materials have recently attracted much attention, and TEPL characterizations, i. e., probing and imaging, and even control at the nanoscale, have been extensively studied. In this review, we discuss the fundamental working mechanism of PL enhancement by plasmonic tip, and then highlight recent advances in TEPL studies for low-dimensional quantum materials. Finally, we discuss several remaining challenges of TEPL nano-spectroscopy and nano-imaging, such as implementation in non-ambient media and in situ environments, limitations in sample structure, and control of near-field polarization, with perspectives of the approach and its applications.
Keywords:
low-dimensional quantum materials
plasmonic tip
tip-enhanced photoluminescence (TEPL)
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Journal

Nanophotonics cover
Nanophotonics
IF:
6.6
Papers:
2.9K
Citations:
1.6W

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