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Using a programmable interferometer for digital phase-shifting speckle interferometry
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DOI：10.1016/S0143-8166(96)00123-6.png)
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摘要
En 中文
The use of a programmable phase-shifting interferometer to detect the deformation of scattering surfaces is described. The interferometer is a commercial instrument in use for optical resting applications; the sample surface is imaged as a speckle pattern. The measuring procedure and the program are outlined, and an experimental demonstration on an aluminium plate under load is given. (C) 1997 Elsevier Science Ltd.
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