.png){kind=icon}
返回
Work Function Variations in Twisted Graphene Layers
.png){kind=icon}
OA
AI
DOI：10.1038/s41598-018-19631-4.png)
.png){kind=icon}
.png){kind=icon}
分享.png){kind=icon}
收藏
摘要
En 中文
By combining optical imaging, Raman spectroscopy, kelvin probe force microscopy (KFPM), and photoemission electron microscopy (PEEM), we show that graphene's layer orientation, as well as layer thickness, measurably changes the surface potential (Phi). Detailed mapping of variable-thickness, rotationally-faulted graphene films allows us to correlate Phi with specific morphological features. Using KPFM and PEEM we measure Delta Phi up to 39 mV for layers with different twist angles, while Delta Phi ranges from 36-129 mV for different layer thicknesses. The surface potential between different twist angles or layer thicknesses is measured at the KPFM instrument resolution of <= 200 nm. The PEEM measured work function of 4.4 eV for graphene is consistent with doping levels on the order of 10(12)cm(-2). We find that F scales linearly with Raman G-peak wavenumber shift (slope = 22.2 mV/cm(-1)) for all layers and twist angles, which is consistent with doping-dependent changes to graphene's Fermi energy in the 'high' doping limit. Our results here emphasize that layer orientation is equally important as layer thickness when designing multilayer two-dimensional systems where surface potential is considered.
AI总结
对已上传原文的论文进行重点信息的提取，主要内容包括：简要概述、研究摘要、背景介绍、关键亮点、图文解析、展望与总结。
期刊
IF:
3.9
论文数:
27.9W
被引数:
83.5W
机构
引用论文
Experimental Determination of the Ionization Energies of MoSe2, WS2, and MoS2 on SiO2 Using Photoemission Electron Microscopy.png)
ACS NANOOAAI
ACS NANOIF16
OAAI分享收藏分享收藏A rapid antimicrobial photodynamic water treatment strategy utilizing a xanthene dye with subsequent removal by Goethite NanoparticlesChemosphereOAAI
ChemosphereIF0
OAAI分享收藏The interlayer screening effect of graphene sheets investigated by Kelvin probe force microscopy
PREAI
分享收藏
查看更多内容