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X-ray ptychography using randomized zone plates
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DOI：10.1364/OE.26.014915.png)
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摘要
En 中文
We have developed a randomized grating condenser zone plate (GCZP) that provides a mu m-scale probe for use in x-ray ptychography. This delivers a significantly better x-ray throughput than probes defined by pinhole apertures, while providing a clearly-defined level of phase diversity to the illumination on the sample, and helping to reduce the dynamic range of the detected signal by spreading the zero-order light over an extended area of the detector. The first use of this novel x-ray optical element has been demonstrated successfully for both amplitude and phase contrast imaging using soft x-rays on the TwinMic beamline at the Elettra synchrotron. Published by The Optical Society under the terms of the Creative Commons Attribution 4.0 License.
Keyword:
DIFFRACTIVE OPTICAL-ELEMENTS
WATER WINDOW
PHASE RETRIEVAL
MICROSCOPY
RESOLUTION
TRANSMISSION
ILLUMINATION
ALGORITHM
CHARGE
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期刊
IF:
3.3
论文数:
6.1W
被引数:
14.3W
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