X-ray wavefront characterization using a rotating shearing interferometer technique

doi:10.1364/OE.19.016550

X-ray wavefront characterization using a rotating shearing interferometer technique

2011-08-12

52

OA

AI

DOI：10.1364/OE.19.016550

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A fast and accurate method to characterize the X-ray wavefront by rotating one of the two gratings of an X-ray shearing interferometer is described and investigated step by step. Such a shearing interferometer consists of a phase grating mounted on a rotation stage, and an absorption grating used as a transmission mask. The mathematical relations for X-ray Moire fringe analysis when using this device are derived and discussed in the context of the previous literature assumptions. X-ray beam wavefronts without and after X-ray reflective optical elements have been characterized at beamline B16 at Diamond Light Source (DLS) using the presented X-ray rotating shearing interferometer (RSI) technique. It has been demonstrated that this improved method allows accurate calculation of the wavefront radius of curvature and the wavefront distortion, even when one has no previous information on the grating projection pattern period, magnification ratio and the initial grating orientation. As the RSI technique does not require any a priori knowledge of the beam features, it is suitable for routine characterization of wavefronts of a wide range of radii of curvature. (C) 2011 Optical Society of America

Keyword:

GRATING INTERFEROMETER

PHASE RETRIEVAL

COHERENCE

X-ray wavefront characterization using a rotating shearing interferometer technique

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