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A Compact Model for Interface-Type Self-Rectifying Resistive Memory With Experiment Verification

delete2024-01-01
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OA
AI
J
Jinwoo Kim
J
Jun-Seok Beom
H
Hong‐Sub Lee
N
Nam-Seog Kim *
DOI:10.1109/ACCESS.2024.3349463delete
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Abstract

Abstract

En 中文
Resistive random access memory (RRAM), a new non-volatile memory, enables hardware accelerators based on in-memory computing with improved throughput and energy efficiency, enabling machine learning on-the-fly inference at the edge. However, sneak-path currents in RRAM crossbar arrays (CBAs) can cause crosstalk, limiting high-density applications. The best choice for suppressing leakage current is self-rectifying RRAM (SRR). Interface-type RRAMs offer CMOS compatibility, better controllability, higher reliability, and lower power consumption compared to filament-type counterparts. However, while there is much research on the filament-type RRAMs, there is little research and no measurement validation on the interface-type RRAMs. In this paper, a compact model of the interface-type RRAM is developed for circuit and system exploration. The model includes Schottky barrier diode, effective layer resistance, nano-battery effect, parasitic resistance, and capacitance. It also has a dynamic behavior model, including device-to-device variation, retention, and endurance. Compared with measurements, it reproduces high accuracy of 98.97% in DC and 98.05% in AC. The proposed model is applied to a neuromorphic 64 x 64 SRR CBA with 32-bit fixed-point precision. A nano-battery bias scheme is also proposed to zero the current of RRAMs having non-zero I-V crossing points, reducing the sneak-pass current error to 0.02%. A vector matrix multiplication application demonstrates 3.44 TOPS/W with a 50:50 LRS to HRS ratio, and a deep neural network on a VGG-8 architecture using the CIFAR-10 dataset observes an accuracy degradation of 1.36%.
Keywords:
Compact model
crossbar array
interface-type RRAM
multiply and accumulate (MAC)
nano-battery effect
parasitic capacitance
parasitic resistance
resistive random access memory (RRAM)
self-rectifying RRAM (SRR)
vector matrix multiplication (VMM)

Journal

IEEE Access cover
IEEE Access
IF:
3.6
Papers:
9.8W
Citations:
29.4W

Organization

C
Chungbuk National University
Scholars:
8.5K
Papers: 8.0K
Citations: 6.4K
K
kyung hee university
Scholars:
2.3W
Papers: 2.2W
Citations: 234
Cited Papers

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