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A Digital Twin Framework With Bayesian Optimization and Deep Learning for Semiconductor Process Control
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DOI：10.1109/ACCESS.2025.3551332.png)
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Abstract
En 中文
This paper introduces an intelligent optimization framework that integrates Digital Twin (DT) technology, deep learning, and a tailored Multi-Restart Bayesian Optimization with Random Initialization (MRBORI) to enhance parameter control and yield in semiconductor manufacturing. The proposed framework synergizes XGBoost-based feature selection, which identifies critical parameters in high-dimensional spaces, with a custom deep learning surrogate model that captures complex nonlinear interactions. Building on these insights, the MRBORI strategy leverages multiple optimization restarts, each initialized randomly, to mitigate local minima risks and systematically explore broad parameter spaces. Experimental validation using real-world data from an epitaxial silicon carbide (Epi SiC) process demonstrates notably tighter thickness control and improved yield compared to traditional methods. By unifying DT-driven real-time insights with advanced machine learning and multi-restart optimization, this framework offers a robust and precise solution for tackling the complexities of modern semiconductor manufacturing.
Keywords:
Optimization
Semiconductor process modeling
Real-time systems
Process control
Semiconductor device modeling
Semiconductor device manufacture
Silicon carbide
Bayes methods
Predictive models
Manufacturing
Digital twin
deep learning
machine learning
XGBoost
multi-restart Bayesian optimization
yield prediction
optimized process parameters
feature selection
semiconductor manufacturing
Journal
IF:
3.6
Papers:
9.8W
Citations:
29.4W