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A Novel Adaptive Testing Method Using Convolutional Neural Networks

delete2025-10-01
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PRE
AI
S
Shin, Daeryong
S
S. B. Oh
W
WanSoo Kim
H
HyunJin Kim *
DOI:10.5573/JSTS.2025.54.5.610delete
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Abstract

Abstract

En 中文
In this work, we present a novel adaptive testing method based on convolutional neural networks (CNNs). We propose a conversion method of test patterns into spectral images using the fast Fourier transform (FFT), which enables consistent dimensionality across various circuits and allows the CNN to extract frequency-domain features. Moreover, we investigate the effect of different types of spectral images by comparing a single-channel magnitude image with a multi-channel image that includes magnitude, real, and imaginary parts. Experimental results on the ISCAS '85 benchmark circuits show that the proposed method achieves over 95% accuracy with a maximum of 97% reduced parameters compared to MLP and conventional CNNs. Therefore, we demonstrate the effectiveness and scalability of the proposed method for adaptive testing.
Keywords:
Adaptive testing
circuit
convolutional neural networks
fast Fourier transform
test pattern

Journal

J
Journal of Semiconductor Technology and Science
IF:
0.8
Papers:
51
Citations:
0

Organization

D
Dankook University
Scholars:
5.6K
Papers: 5.7K
Citations: 5.1K