arrow
Return

A Novel Ensemble Classifier Selection Method for Software Defect Prediction

delete2025-01-01
delete0
delete
OA
AI
董鑫 cover
董鑫 (Dong, Xin)
J
Jie Wang
Y
Yan Liang *
DOI:10.1109/ACCESS.2025.3537658delete
deleteOriginal
deleteShare
deleteSave
Abstract

Abstract

En 中文
The presence of software defects significantly impacts the quality of software systems and increases development and maintenance costs. To improve system quality and reduce costs, it is necessary to predict software defects in the early stages of the software development lifecycle. This paper proposes Double Fault Disagreement (DFD), a novel diversity metric and method for selecting competent base classifiers for ensemble learning-based software defect prediction. To consider the diversity features of the base learners, several base learners with strong diversity are chosen to build ensemble learning. This method makes full use of the diversity characteristics of base learners, leverages their classification ability, optimizes the selection method for ensemble learning, and enhances the predictive performance of the ensemble model. The experimental results demonstrate that the DFD ensemble learning-based software defect prediction model outperforms the ten other models, including five common machine learning (ML) classification algorithms (logistic regression (LR), na & iuml;ve Bayes (NB), K-nearest neighbor (KNN), decision tree (DT), and support vector machine (SVM)), two deep learning (DL) algorithms (multi-layer perceptron (MLP) and convolutional neural network (CNN)), and three ensemble learning algorithms (random forest (RF), extreme gradient boosting (XGB), and stacking). The DFD model achieves superior performance on eight public NASA and PROMISE datasets (six of which are imbalanced) across five performance indicators, including area under the curve (AUC), geometric mean (G-Mean), F1 score, Matthews correlation coefficient (MCC), and Balance. Furthermore, the DFD method is not only highly performant but also requires a small number of base learners to converge rapidly, thereby reducing the amount of data and computation time required.
Keywords:
Ensemble learning
Predictive models
Measurement
Computational modeling
Classification algorithms
Software
Volume measurement
Weight measurement
Stacking
Prediction algorithms
Diversity measures
double fault disagreement
ensemble classifier selection
imbalanced data classification
software defect prediction

Journal

IEEE Access cover
IEEE Access
IF:
3.6
Papers:
9.8W
Citations:
29.4W

Organization

C
Chengdu Technological University
Scholars:
779
Papers: 540
Citations: 343
Cited Papers

Cited Papers

The indole motif is essential for the antitrypanosomal activity of N5-substituted paullones
err2023-11-30
err0
errOAAI
errIrina Ihnatenko; Marco J. Müller; Oliver C. F. Orban; Jens C. Lindhof; Diego Benítez; Cecilia Ortíz; Estefanía Dibello; Leonardo L. Seidl; Marcelo A. Comini; Conrad Kunick
errShare
errSave
Linear Cost-sensitive Max-margin Embedded Feature Selection for SVM
err2022-07-01
err15
PREAI
errAram, Khalid Y.; Lam, Sarah S.; Khasawneh, Mohammad T.
errShare
errSave
Deep learning based software defect prediction
err2020-04-01
err98
PREAI
errQiao, Lei; Li, Xuesong; Umer, Qasim; Guo, Ping
errShare
errSave
A survey on imbalanced learning: latest research, applications and future directions
err2024-05-09
err22
errOAAI
errChen, Wuxing; Yang, Kaixiang; Yu, Zhiwen; Shi, Yifan; Chen, C. L. Philip
errShare
errSave
errShare
errSave
Vision in Multiple Sclerosis
err2011-12-01
err0
errOAAI
errReiko E. Sakai; Daniel J. Feller; Kristin M. Galetta; Steven L. Galetta; Laura J. Balcer
errShare
errSave
Universal Ensemble-Embedding Graph Neural Network for Direct Prediction of Optical Spectra from Crystal Structures
err2024-09-12
err4
errOAAI
errHung, Nguyen Tuan; Okabe, Ryotaro; Chotrattanapituk, Abhijatmedhi; Li, Mingda
errShare
errSave
Arsenic removal from aqueous solutions by adsorption using novel MIL-53(Fe) as a highly efficient adsorbent
err2015-01-01
err0
PREAI
errTuan. A. Vu; Giang. H. Le; Canh. D. Dao; Lan. Q. Dang; Kien. T. Nguyen; Quang. K. Nguyen; Phuong. T. Dang; Hoa. T. K. Tran; Quang. T. Duong; Tuyen. V. Nguyen; Gun. D. Lee
errShare
errSave
researcher View more