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A peak position comparison method for high-speed quantitative Laue microdiffraction data processing
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DOI：10.1016/j.scriptamat.2017.09.005.png)
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Abstract
En 中文
Indexing Laue patterns of a synchrotron microdiffraction scan can take as much as ten times longer than collecting the data, impeding efficient structural analysis using this technique. Here a novel strategy is developed. By comparing the peak positions of adjacent Laue patterns and checking the intensity sequence, grain and phase boundaries are identified, requiring only a limited number of indexing steps for each individual grain. Using this protocol, the Laue patterns can be indexed on the fly as they are taken. The validation of this method is demonstrated by analyzing the microstructure of a laser 3D printed multi-phase/multi-grain Ni-based superalloy. (C) 2017 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
Keywords:
Polychromatic X-ray Laue microdiffraction
Orientation mapping
Phase distribution
Plastic deformation
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