.png){kind=icon}
.png){kind=icon}
Return
Accelerating covering array generation by combinatorial join for industry scale software testing
.png){kind=icon}
OA
AI
DOI：10.7717/peerj-cs.720.png)
.png){kind=icon}
.png){kind=icon}
Share.png){kind=icon}
Save
Abstract
En 中文
Combinatorial interaction testing, which is a technique to verify a system with numerous input parameters, employs a mathematical object called a covering array as a test input. This technique generates a limited number of test cases while guaranteeing a given combinatorial coverage. Although this area has been studied extensively, handling constraints among input parameters remains a major challenge, which may significantly increase the cost to generate covering arrays. In this work, we propose a mathematical operation, called weaken-product based combinatorial join, which constructs a new covering array from two existing covering arrays. The operation reuses existing covering arrays to save computational resource by increasing parallelism during generation without losing combinatorial coverage of the original arrays. Our proposed method significantly reduce the covering array generation time by 13-96% depending on use case scenarios.
Keywords:
Combinatorial testing
Automated testing
Combinatorial interaction testing
Covering array
Variable strength covering array
Constrained covering array
Software testing
Software
Combinatorial explosion
Automated combinatorial test generation
AI Summary
Key information extracted from the uploaded paper, including a brief overview, abstract, background, key highlights, visual analysis, and future outlook.