Advanced denoising for X-ray ptychography

doi:10.1364/OE.27.010395

Advanced denoising for X-ray ptychography

2019-04-01

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AI

DOI：10.1364/OE.27.010395

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Abstract

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The success of ptychographic imaging experiments strongly depends on achieving high signal-to-noise ratio. This is particularly important in nanoscale imaging experiments when diffraction signals are very weak and the experiments are accompanied by significant parasitic scattering (background), outliers or correlated noise sources. It is also critical when rare events, such as cosmic rays, or bad frames caused by electronic glitches or shutter timing malfunction take place. In this paper, we propose a novel iterative algorithm with rigorous analysis that exploits the direct forward model for parasitic noise and sample smoothness to achieve a thorough characterization and removal of structured and random noise. We present a formal description of the proposed algorithm and prove its convergence under mild conditions. Numerical experiments from simulations and real data (both soft and hard X-ray beamlines) demonstrate that the proposed algorithms produce better results when compared to state-of-the-art methods. (c) 2019 Optical Society of America under the terms of the OSA Open Access Publishing Agreement

Keywords:

PHASE RETRIEVAL

IMAGE-RESTORATION

RESOLUTION

POISSON

Advanced denoising for X-ray ptychography

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