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An inverse chemo-mechanical framework for diffusion-induced stress in substrate-constrained electrodes under galvanostatic lithiation
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DOI：10.1016/j.mtla.2026.102806.png)
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Abstract
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An inverse analytical chemo-mechanical framework is developed for diffusion-induced stress in a lithiating electrode film bonded to a substrate under galvanostatic operation. Combining the transient diffusion solution with force and moment balance, the model uses a prescribed curvature history to identify the effective biaxial modulus and in-plane strain, and thereby reconstruct the associated stress evolution and through-thickness stress distribution. Parametric studies are conducted to assess the roles of current density i0 , diffusion coefficient D , and electrode thickness L under a common curvature trajectory κ(t) . The results are therefore interpreted as inverse sensitivity responses, rather than as direct predictions of curvature evolution for varying material and operating conditions. Within this setting, lithiation produces progressive electrode softening and increasing compressive stress. The response is governed primarily by D and L : diffusivity controls stress localization through concentration-gradient smoothing, whereas thickness controls the overall stress level and reduces both the average and peak stresses as L increases. The peak-stress location further shifts from the active surface toward the electrode/substrate interface with increasing D , indicating a kinetic transition in the dominant failure-prone region. Coupled with measured in situ curvature histories, the framework provides a practical route for model calibration and operando identification of effective electrode properties.
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